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US Patent Issued to INNOVATION FOR CREATIVE DEVICES on Nov. 3 for "Electrostatic device and operation method therefor" (South Korean Inventors)

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,785,050, issued on Nov. 3, was assigned to INNOVATION FOR CREATIVE DEVICES Co. LTD. (Anseong-si, South Korea). "Electrostatic device and operati... Read More


US Patent Issued to Hitachi High-Tech on Nov. 3 for "Plasma processing apparatus" (Japanese Inventors)

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,785,051, issued on Nov. 3, was assigned to Hitachi High-Tech Corp. (Tokyo). "Plasma processing apparatus" was invented by Kyohei Horikawa (Tokyo... Read More


US Patent Issued to SPP Technologies on Nov. 3 for "Substrate processing apparatus" (Japanese Inventor)

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,785,052, issued on Nov. 3, was assigned to SPP Technologies Co. Ltd. (Tokyo). "Substrate processing apparatus" was invented by Kazuya Ota (Amaga... Read More


US Patent Issued to DH Technologies Development on Nov. 3 for "Bubble introduction into a steady-state sample stream" (Canadian Inventors)

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,785,053, issued on Nov. 3, was assigned to DH Technologies Development Pte. Ltd. (Singapore). "Bubble introduction into a steady-state sample st... Read More


US Patent Issued to DH TECHNOLOGIES DEVELOPMENT on Nov. 3 for "Ion mirror for time-of-flight mass spectrometer" (Canadian Inventors)

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,785,054, issued on Nov. 3, was assigned to DH TECHNOLOGIES DEVELOPMENT PTE. LTD. (Singapore). "Ion mirror for time-of-flight mass spectrometer" ... Read More


US Patent Issued to SHIMADZU on Nov. 3 for "Mass spectrometer and mass spectrometry method" (Japanese Inventors)

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,785,055, issued on Nov. 3, was assigned to SHIMADZU Corp. (Kyoto, Japan). "Mass spectrometer and mass spectrometry method" was invented by Kazut... Read More


US Patent Issued to SHIMADZU on Nov. 3 for "Mass spectrometer and method for establishing vacuum system thereof" (Chinese Inventors)

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,785,056, issued on Nov. 3, was assigned to SHIMADZU Corp. (Kyoto, Japan). "Mass spectrometer and method for establishing vacuum system thereof" ... Read More


US Patent Issued to Micromass UK on Nov. 3 for "Mass spectrometer having high sampling duty cycle" (British Inventor)

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,785,057, issued on Nov. 3, was assigned to Micromass UK Ltd. (Wilmslow, Great Britain). "Mass spectrometer having high sampling duty cycle" was ... Read More


US Patent Issued to BRUKER SWITZERLAND on Nov. 3 for "Ion analysis apparatus and method" (Swiss Inventors)

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,785,058, issued on Nov. 3, was assigned to BRUKER SWITZERLAND AG (Fallanden, Switzerland). "Ion analysis apparatus and method" was invented by D... Read More


US Patent Issued to Industry Academic Cooperation Foundation of Yeungnam University on Nov. 3 for "Electrode, method for preparing same, and electrostatic discharge system comprising same" (South Korean Inventors)

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,785,059, issued on Nov. 3, was assigned to Industry Academic Cooperation Foundation of Yeungnam University (Gyeongsan-si, South Korea). "Electro... Read More